Energy Selective Secondary Electron Detection in SEM for the Characterization of Polymers (2017)

First Author: Rodenburg C

Attributed to: Quantitative, high resolution two-and-three dimensional dopant mapping in the Scanning Electron Microscope by Secondary Electron Spectro-Micro funded by EPSRC

No abstract provided

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: S2