Depth profile analysis for MgB2 thin films, formed by B implantation in Mg ribbons using energetic ion backscatterings (2007)

First Author: Peng N

Attributed to: University of Surrey Ion Beam Centre funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.physc.2007.04.120

Publication URI: http://dx.doi.org/10.1016/j.physc.2007.04.120

Type: Journal Article/Review

Parent Publication: Physica C: Superconductivity and its Applications