Accurate ion beam analysis in the presence of surface roughness (2008)
Attributed to:
University of Surrey Ion Beam Centre
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/0022-3727/41/20/205303
Publication URI: http://dx.doi.org/10.1088/0022-3727/41/20/205303
Type: Journal Article/Review
Parent Publication: Journal of Physics D: Applied Physics
Issue: 20