Annealing and deposition temperature dependence of the bandgap of amorphous FeSi 2 fabricated by co-sputter deposition (2008)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/0268-1242/23/3/035007
Publication URI: http://dx.doi.org/10.1088/0268-1242/23/3/035007
Type: Journal Article/Review
Parent Publication: Semiconductor Science and Technology
Issue: 3