Characterization of paint layers by simultaneous self-consistent fitting of RBS/PIXE spectra using simulated annealing (2008)
Attributed to:
University of Surrey Ion Beam Centre
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.nimb.2007.12.091
Publication URI: http://dx.doi.org/10.1016/j.nimb.2007.12.091
Type: Journal Article/Review
Parent Publication: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Issue: 8