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Constraints on micro-Raman strain metrology for highly doped strained Si materials (2008)

First Author: O'Reilly L

Attributed to: University of Surrey Ion Beam Centre funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.2942392

Publication URI: http://dx.doi.org/10.1063/1.2942392

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 23