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Materials Patterning and Characterisation at the Nanometre Scale Using Focused MeV Ion Beams: Present Achievements and Future Prospects (2009)

First Author: Grime G

Attributed to: University of Surrey Ion Beam Centre funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.12693/aphyspola.115.467

Publication URI: http://dx.doi.org/10.12693/aphyspola.115.467

Type: Journal Article/Review

Parent Publication: Acta Physica Polonica A

Issue: 2