Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS (2010)

First Author: Bailey M
Attributed to:  University of Surrey Ion Beam Centre funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.nimb.2010.02.104

Publication URI: http://dx.doi.org/10.1016/j.nimb.2010.02.104

Type: Journal Article/Review

Parent Publication: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Issue: 11-12