Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS (2010)
Attributed to:
University of Surrey Ion Beam Centre
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.nimb.2010.02.045
Publication URI: http://dx.doi.org/10.1016/j.nimb.2010.02.045
Type: Journal Article/Review
Parent Publication: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Issue: 11-12