Impact of the Aggressive Scaling on the Performance of FinFETs: the Role of a Single Dopant in the Channel (2013)
Attributed to:
Quantum Simulations of Future Solid State Transistors
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1557/opl.2013.895
Publication URI: http://dx.doi.org/10.1557/opl.2013.895
Type: Journal Article/Review
Parent Publication: MRS Proceedings