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Note: Electrical resolution during conductive atomic force microscopy measurements under different environmental conditions and contact forces. (2010)

First Author: Lanza M

Attributed to: Semiconductor Research at the Materials-Device Interface funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.3491956

PubMed Identifier: 21034138

Publication URI: http://europepmc.org/abstract/MED/21034138

Type: Journal Article/Review

Volume: 81

Parent Publication: The Review of scientific instruments

Issue: 10

ISSN: 0034-6748