Note: Electrical resolution during conductive atomic force microscopy measurements under different environmental conditions and contact forces. (2010)
Attributed to:
Semiconductor Research at the Materials-Device Interface
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.3491956
PubMed Identifier: 21034138
Publication URI: http://europepmc.org/abstract/MED/21034138
Type: Journal Article/Review
Volume: 81
Parent Publication: The Review of scientific instruments
Issue: 10
ISSN: 0034-6748