Characterization of Ni thin films following thermal oxidation in air (2014)
Attributed to:
Graphene Flexible Electronics and Optoelectronics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1116/1.4895846
Publication URI: http://dx.doi.org/10.1116/1.4895846
Type: Journal Article/Review
Parent Publication: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
Issue: 5