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Helium ion microscopy based wall thickness and surface roughness analysis of polymer foams obtained from high internal phase emulsion. (2014)

First Author: Rodenburg C

Attributed to: Quantitative, high resolution two-and-three dimensional dopant mapping in the Scanning Electron Microscope by Secondary Electron Spectro-Micro funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2014.01.004

PubMed Identifier: 24525239

Publication URI: http://europepmc.org/abstract/MED/24525239

Type: Journal Article/Review

Volume: 139

Parent Publication: Ultramicroscopy

ISSN: 0304-3991