The effect of oxide overlayers on secondary electron dopant mapping. (2009)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1017/s1431927609090400
PubMed Identifier: 19460180
Publication URI: http://europepmc.org/abstract/MED/19460180
Type: Journal Article/Review
Volume: 15
Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Issue: 3
ISSN: 1431-9276