Investigating individual arsenic dopant atoms in silicon using low-temperature scanning tunnelling microscopy. (2014)

First Author: Sinthiptharakoon K
Attributed to:  Support for the UKCP consortium funded by EPSRC


No abstract provided

Bibliographic Information

Digital Object Identifier:

PubMed Identifier: 24304933

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Type: Journal Article/Review

Volume: 26

Parent Publication: Journal of physics. Condensed matter : an Institute of Physics journal

Issue: 1

ISSN: 0953-8984