Mechanical breakdown of bent silicon nanowires imaged by coherent x-ray diffraction (2013)
Attributed to:
Phase modulation technology for X-ray imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1367-2630/15/12/123007
Publication URI: http://dx.doi.org/10.1088/1367-2630/15/12/123007
Type: Journal Article/Review
Parent Publication: New Journal of Physics
Issue: 12