Mechanical breakdown of bent silicon nanowires imaged by coherent x-ray diffraction (2013)

First Author: Shi X
Attributed to:  Phase modulation technology for X-ray imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1367-2630/15/12/123007

Publication URI: http://dx.doi.org/10.1088/1367-2630/15/12/123007

Type: Journal Article/Review

Parent Publication: New Journal of Physics

Issue: 12