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Coherent X-ray diffraction imaging and characterization of strain in silicon-on-insulator nanostructures. (2014)

First Author: Xiong G

Attributed to: Phase modulation technology for X-ray imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/adma.201304511

PubMed Identifier: 24955950

Publication URI: http://europepmc.org/abstract/MED/24955950

Type: Journal Article/Review

Volume: 26

Parent Publication: Advanced materials (Deerfield Beach, Fla.)

Issue: 46

ISSN: 0935-9648