Coherent X-ray diffraction imaging and characterization of strain in silicon-on-insulator nanostructures. (2014)
Attributed to:
Phase modulation technology for X-ray imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/adma.201304511
PubMed Identifier: 24955950
Publication URI: http://europepmc.org/abstract/MED/24955950
Type: Journal Article/Review
Volume: 26
Parent Publication: Advanced materials (Deerfield Beach, Fla.)
Issue: 46
ISSN: 0935-9648