Coexistence of memory resistance and memory capacitance in TiO2 solid-state devices. (2014)
Attributed to:
Reliably unreliable nanotechnologies
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1186/1556-276x-9-552
PubMed Identifier: 25298759
Publication URI: http://europepmc.org/abstract/MED/25298759
Type: Journal Article/Review
Volume: 9
Parent Publication: Nanoscale research letters
Issue: 1
ISSN: 1556-276X