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Characterization of Ni thin films following thermal oxidation in air (2014)

First Author: De Los Santos Valladares L

Attributed to: Spintronic device physics in Si/Ge Heterostructures. funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1116/1.4895846

Publication URI: http://dx.doi.org/10.1116/1.4895846

Type: Journal Article/Review

Parent Publication: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Issue: 5