Using metallic noncontact atomic force microscope tips for imaging insulators and polar molecules: tip characterization and imaging mechanisms. (2014)

First Author: Gao DZ
Attributed to:  Modelling of Advanced Functional Materials using Terascale Computing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/nn501785q

PubMed Identifier: 24787716

Publication URI: http://europepmc.org/abstract/MED/24787716

Type: Journal Article/Review

Volume: 8

Parent Publication: ACS nano

Issue: 5

ISSN: 1936-0851