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Scanning Probe Microscopy Imaging before and after Atomic Layer Oxide Deposition on a Compound Semiconductor Surface (2012)

First Author: Melitz W

Attributed to: III-V MOSFETs for Ultimate CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.4028/www.scientific.net/ssp.187.9

Publication URI: http://dx.doi.org/10.4028/www.scientific.net/ssp.187.9

Type: Journal Article/Review

Parent Publication: Solid State Phenomena