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A nanoanalytical investigation of the Ga2O3/GaGdO dielectric gate stack for InGaAs based MOSFET devices (2009)

First Author: Longo P

Attributed to: III-V MOSFETs for Ultimate CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.mee.2009.03.131

Publication URI: http://dx.doi.org/10.1016/j.mee.2009.03.131

Type: Journal Article/Review

Parent Publication: Microelectronic Engineering

Issue: 7-9