A nanoanalytical investigation of high-k dielectric gate stacks for GaAs based MOSFET devices (2009)
Attributed to:
III-V MOSFETs for Ultimate CMOS
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.mee.2008.08.013
Publication URI: http://dx.doi.org/10.1016/j.mee.2008.08.013
Type: Journal Article/Review
Parent Publication: Microelectronic Engineering
Issue: 3