A nanoanalytical investigation of high-k dielectric gate stacks for GaAs based MOSFET devices (2009)

First Author: Longo P

Attributed to: III-V MOSFETs for Ultimate CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.mee.2008.08.013

Publication URI: http://dx.doi.org/10.1016/j.mee.2008.08.013

Type: Journal Article/Review

Parent Publication: Microelectronic Engineering

Issue: 3