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Deposition and Characterization of CVD-Grown Ge-Sb Thin Film Device for Phase-Change Memory Application (2012)

First Author: Huang C

Attributed to: EPSRC Centre for Innovative Manufacturing in Photonics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1155/2012/840348

Publication URI: http://dx.doi.org/10.1155/2012/840348

Type: Journal Article/Review

Parent Publication: Advances in OptoElectronics