Deposition and Characterization of CVD-Grown Ge-Sb Thin Film Device for Phase-Change Memory Application (2012)
Attributed to:
EPSRC Centre for Innovative Manufacturing in Photonics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1155/2012/840348
Publication URI: http://dx.doi.org/10.1155/2012/840348
Type: Journal Article/Review
Parent Publication: Advances in OptoElectronics