Characterisation of edgeless technologies for pixellated and strip silicon detectors with a micro-focused X-ray beam (2013)
Attributed to:
Flat panel technology for XFEL
funded by
STFC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/8/01/p01018
Publication URI: http://dx.doi.org/10.1088/1748-0221/8/01/p01018
Type: Journal Article/Review
Parent Publication: Journal of Instrumentation
Issue: 01
ISSN: 1748-0221