Residual stress trend in thermal barrier coatings in through thickness direction measured by photoluminescence piezospectroscopy (2013)

First Author: Chen C

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1179/174367509x12503626841479

Publication URI: http://dx.doi.org/10.1179/174367509x12503626841479

Type: Journal Article/Review

Parent Publication: Advances in Applied Ceramics

Issue: 2