An intelligent and confident system for automatic surface defect quantification in 3D (Nov, 2014) (2015)

First Author: Tailor, M
Attributed to:  EPSRC Centre for Innovative Manufacturing in Intelligent Automation funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: http://www.scientific.net/KEM.649.46

Type: Conference/Paper/Proceeding/Abstract