Electrical activation and electron spin resonance measurements of implanted bismuth in isotopically enriched silicon-28 (2012)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4704561

Publication URI: http://dx.doi.org/10.1063/1.4704561

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 17