Investigation of the internal electric field distribution under in situ x-ray irradiation and under low temperature conditions by the means of the Pockels effect (2010)
Attributed to:
Development of contact technology for CdZnTe pixel radiation detectors
funded by
STFC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/0022-3727/43/8/085102
Publication URI: http://dx.doi.org/10.1088/0022-3727/43/8/085102
Type: Journal Article/Review
Parent Publication: Journal of Physics D: Applied Physics
Issue: 8