Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces. (2014)

First Author: Sweetman A

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3762/bjnano.5.45

PubMed Identifier: 24778964

Publication URI: http://europepmc.org/abstract/MED/24778964

Type: Journal Article/Review

Volume: 5

Parent Publication: Beilstein journal of nanotechnology

ISSN: 2190-4286