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Understanding Sources of Errors in Bit-Patterned Media to Improve Read Channel Performance (2008)

First Author: Nutter P

Attributed to: Nano-Patterned Storage Media: Noise and Density Limits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tmag.2008.2002516

Publication URI: http://dx.doi.org/10.1109/tmag.2008.2002516

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Magnetics

Issue: 11