Dependence of Write-Window on Write Error Rates in Bit Patterned Media (2010)

First Author: Kalezhi J
Attributed to:  Nano-Patterned Storage Media: Noise and Density Limits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tmag.2010.2052626

Publication URI: http://dx.doi.org/10.1109/tmag.2010.2052626

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Magnetics

Issue: 10