Error Events Due to Island Size Variations in Bit Patterned Media (2010)

First Author: Shi Y
Attributed to:  Nano-Patterned Storage Media: Noise and Density Limits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tmag.2010.2041047

Publication URI: http://dx.doi.org/10.1109/tmag.2010.2041047

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Magnetics

Issue: 6