A statistical model of write-errors in bit patterned media (2012)

First Author: Kalezhi J
Attributed to:  Nano-Patterned Storage Media: Noise and Density Limits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.3691947

Publication URI: http://dx.doi.org/10.1063/1.3691947

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 5