📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

A statistical model of write-errors in bit patterned media (2012)

First Author: Kalezhi J

Attributed to: Nano-Patterned Storage Media: Noise and Density Limits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.3691947

Publication URI: http://dx.doi.org/10.1063/1.3691947

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 5