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Submicron-scale depth profiling of residual stress in amorphous materials by incremental focused ion beam slotting (2012)

First Author: Winiarski B

Attributed to: 3D Assessment of Surface Integrity and Performance funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.actamat.2011.12.035

Publication URI: http://dx.doi.org/10.1016/j.actamat.2011.12.035

Type: Journal Article/Review

Parent Publication: Acta Materialia

Issue: 5