Development of a novel profile measurement system for actively planed surfaces (2011)
Attributed to:
EPSRC Centre for Innovative Manufacturing in Intelligent Automation
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.measurement.2010.11.005
Publication URI: http://dx.doi.org/10.1016/j.measurement.2010.11.005
Type: Journal Article/Review
Parent Publication: Measurement
Issue: 2