A method for accurate texture determination of thin oxide films by glancing-angle laboratory X-ray diffraction (2014)
Attributed to:
LIGHT ALLOYS TOWARDS ENVIRONMETALLY SUSTAINABLE TRANSPORT: 2nd GENERATION SOLUTIONS FOR ADVANCED METALLIC SYSTEMS (LATEST2)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1107/s1600576714000569
Publication URI: http://dx.doi.org/10.1107/s1600576714000569
Type: Journal Article/Review
Parent Publication: Journal of Applied Crystallography
Issue: 2