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Electrical Properties of the 3C-SiC/SiO2 Interface Grown With High Temperature Oxidation (2014)

First Author: Sharma Y

Attributed to: Vehicle Electrical Systems Integration (VESI) funded by UKRI

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.14331/ijfps.2014.330076

Publication URI: http://dx.doi.org/10.14331/ijfps.2014.330076

Type: Journal Article/Review

Parent Publication: International Journal of Fundamental Physical Sciences

Issue: 4