Electrical Properties of the 3C-SiC/SiO2 Interface Grown With High Temperature Oxidation (2014)
Attributed to:
Vehicle Electrical Systems Integration (VESI)
funded by
UKRI
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.14331/ijfps.2014.330076
Publication URI: http://dx.doi.org/10.14331/ijfps.2014.330076
Type: Journal Article/Review
Parent Publication: International Journal of Fundamental Physical Sciences
Issue: 4