📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Mutation Scanning in Wheat by Exon Capture and Next-Generation Sequencing. (2015)

First Author: King R
Attributed to:  Maximising yield potential of wheat funded by BBSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1371/journal.pone.0137549

PubMed Identifier: 26335335

Publication URI: http://europepmc.org/abstract/MED/26335335

Type: Journal Article/Review

Volume: 10

Parent Publication: PloS one

Issue: 9

ISSN: 1932-6203