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Conductance tomography of conductive filaments in intrinsic silicon-rich silica RRAM. (2015)

First Author: Buckwell M

Attributed to: Resistive switches (RRAM) and memristive behaviour in silicon-rich silicon oxides funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/c5nr04982b

PubMed Identifier: 26482563

Publication URI: http://europepmc.org/abstract/MED/26482563

Type: Journal Article/Review

Volume: 7

Parent Publication: Nanoscale

Issue: 43

ISSN: 2040-3364