Long Lifetime Hole Traps at Grain Boundaries in CdTe Thin-Film Photovoltaics. (2015)

First Author: Mendis BG
Attributed to:  Carrier lifetime measurement at grain boundaries in thin-film solar cells funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1103/physrevlett.115.218701

PubMed Identifier: 26636877

Publication URI: http://europepmc.org/abstract/MED/26636877

Type: Journal Article/Review

Volume: 115

Parent Publication: Physical review letters

Issue: 21

ISSN: 0031-9007