An Experimental Investigation of the Tradeoff between Switching Losses and EMI Generation With Hard-Switched All-Si, Si-SiC, and All-SiC Device Combinations (2014)

First Author: Oswald N

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tpel.2013.2278919

Publication URI: http://dx.doi.org/10.1109/tpel.2013.2278919

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Power Electronics

Issue: 5