Origins of hillock defects on GaN templates grown on Si(111) (2016)
Attributed to:
Lighting the Future
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.jcrysgro.2015.11.005
Publication URI: http://dx.doi.org/10.1016/j.jcrysgro.2015.11.005
Type: Journal Article/Review
Parent Publication: Journal of Crystal Growth