Variability Aware Simulation Based Design- Technology Cooptimization (DTCO) Flow in 14 nm FinFET/SRAM Cooptimization (2015)
Attributed to:
Atomic Scale Simulation of Nanoelectronic Devices
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2014.2363117
Publication URI: http://dx.doi.org/10.1109/ted.2014.2363117
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 6