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Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns (2015)

First Author: Vespucci S

Attributed to: Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC. funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1103/physrevb.92.205301

Publication URI: http://dx.doi.org/10.1103/physrevb.92.205301

Type: Journal Article/Review

Parent Publication: Physical Review B

Issue: 20